Custom Optical Test Bench for Wavefront, MTF & PSF Metrology

The Custom Optical Testing Bench is a fully bespoke wavefront metrology solution engineered to address optical testing challenges beyond the reach of standard,...

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Custom Optical Test Bench for Wavefront, MTF & PSF Metrology

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Custom optical test bench (1)

Custom Optical Test Bench for Wavefront, MTF & PSF Metrology

The Custom Optical Testing Bench is a fully bespoke wavefront metrology solution engineered to address optical testing challenges beyond the reach of standard, off-the-shelf systems. Built around high-resolution wavefront sensing and a modular, reconfigurable architecture, each bench is tailored to exact application requirements, supporting a wide spectral range from UV to LWIR. Flexible optical layouts enable multiple measurement paths, including single- or double-pass configurations, on-axis or off-axis testing, and infinite or finite conjugate setups.

Designed for demanding projects involving complex optical assemblies, laser systems, and specialised metrology tasks, the system delivers accurate, repeatable characterisation across diverse test conditions. Its adaptable design allows seamless integration of custom optics, sources, detectors, and alignment modules to match unique performance criteria and environmental constraints.

The Custom Optical Testing Bench provides precise evaluation of critical optical parameters such as wavefront error (WFE), modulation transfer function (MTF), point spread function (PSF), and direct comparison against optical design specifications. United Spectrum Instruments is the official distributor of Phasics products in India, providing sales, technical support, and deep application expertise to seamlessly integrate Phasics-based systems—including advanced industrial and R&D workflows—into demanding optical test environments

The Custom Optical Testing Bench is tailored to your project’s unique measurement and environmental requirements. Unlike fixed test stations, this custom platform can be engineered for any spectral range — including UV, visible, near-IR, extended SWIR, mid-IR and LWIR — and supports an array of configurations such as single or double pass testing and infinite and finite optical paths. It is assembled using advanced wavefront metrology components, delivering precise wavefront, MTF and PSF data in configurations that standard off-the-shelf systems cannot support. Designed by multidisciplinary optics and metrology engineers, these solutions address complex installations, special sample sizes or unique alignment challenges.

Specification Category Details
Wavelength Range UV, VIS, NIR, SWIR, MWIR, LWIR
Configuration Options Single-pass or double-pass
Measurement Types Wavefront error (WFE), MTF, PSF, design comparison
Object Setup On-axis or off-axis; infinite-to-finite or finite-to-infinite
Applicable Beam Size Few millimetres to several hundred millimetres
Polarization Dependence None
Custom Engineering Optical, mechanical, electrical, software
Output Data High-accuracy wavefront and imaging metrics
Precision Nanometric phase accuracy
Flexibility Modular, customisable components

Fully Customised to Unique Needs

The core strength of the Custom Optical Testing Bench is its tailored design. Unlike fixed optical metrology stations, this system is engineered from the ground up to meet project-specific demands — whether that’s measuring unusual optical geometries, handling non-standard beam sizes, operating in special environmental conditions or interfacing with legacy manufacturing processes. Its flexible architecture supports multiple measurement configurations and ensures optimal performance for your unique application.

Multi-Spectral Measurement Capability

This custom test bench supports broad spectral ranges from ultraviolet to long-wave infrared, enabling measurement at the design or operating wavelengths most relevant to your application. Whether working with UV optics for lithography, visible lenses for imaging, or mid- and long-wave infrared components for thermal systems, the system can be configured to match the required spectral band.

Comprehensive Metrology Outputs

Equipped with the latest wavefront sensing technology, the custom bench captures key optical quality metrics — including wavefront error (WFE), modulation transfer function (MTF) and point spread function (PSF). Tailored software integrations allow direct comparison to design models, quantifying deviations and enabling rigorous quality control. These comprehensive outputs are essential for validating optical performance, diagnosing alignment issues or certifying optical assemblies.

Configurable Measurement Pathways

Whether your application requires single-pass or double-pass optical test setups, on-axis or off-axis sampling, or infinite to finite object space, the bench is configured accordingly. This adaptability ensures that even unconventional optical systems or complex assemblies can be measured accurately without compromising precision or alignment fidelity.

Engineering and Support Excellence

Designed by a multidisciplinary team of optical, mechanical and software engineers, the platform integrates advanced measurement hardware with tailored control and data analysis software. This end-to-end custom engineering ensures seamless measurement workflows, robust data quality and adaptability for future upgrades.

Advanced Optical Manufacturing & Production

Optical manufacturers working with complex lens systems, high-precision assemblies or metasurface components often need bespoke metrology arrangements that standard test stations cannot address. Custom optical benches provide comprehensive wavefront and image quality analysis aligned to manufacturing tolerances, supporting quality control, production optimization and yield improvement.

Laser System Qualification & Adaptive Optics

In laser development and adaptive optics testing, specific beam geometries, multi-wavelength alignment paths, and custom environmental constraints (like vacuum chambers or thermal cycling) require tailored solutions. Custom benches allow measurement configuration tuning — including double-pass setups and special reference optics — enabling precise wavefront characterization in research and high-energy environments.

Aerospace & Defense Metrology

Defense and aerospace optical systems — including satellite optics, reconnaissance sensors and high-stability imaging systems — often demand bespoke metrology to meet stringent performance and environmental specifications. Custom benches configured for UV to LWIR spectral bands ensure accurate qualification at relevant operational wavelengths.

Scientific Research & Experimental Optics

Universities and research institutes exploring novel optical designs, freeform optics, or multi-modal imaging benefit from bespoke test benches that adapt to unique sample geometries, experimental setups and non-standard optical paths. These systems accelerate research by providing precise, repeatable wavefront and imaging data tailored to the experiment.

Semiconductor & Photonics Test Environments

Semiconductor lithography optics, photonics assemblies, and micro-optical systems often require meticulous wavefront and image quality characterization at design wavelengths. Custom benches configured for UV or specialized NIR/SWIR bands help ensure fabrication accuracy and device performance compliance.

United Spectrum Instruments is the authorised distributor of custom optical metrology solutions, offering expert guidance backed by deep photonics and wavefront measurement expertise. We support customers from bench configuration and system integration to performance optimisation across R&D, production, and specialised testing environments. With strong local presence, we ensure long-term reliability and measurement confidence.

  • Authorised distributor of advanced custom optical metrology and testing systems

  • Expertise in wavefront analysis, system specification, and workflow integration

  • Local installation support, specialist training, and responsive after-sales service

  • Reliable partner for precise, application-driven results aligned with project goals

FAQs

A tailored optical test platform designed to address specific wavefront metrology requirements not covered by standard instruments.

 Configurable for UV, visible, near-IR, SWIR, MWIR and LWIR bands to match your optical application.

Includes wavefront error (WFE), modulation transfer function (MTF), point spread function (PSF), and comparison to design specifications.

Yes — it supports single and double-pass setups, on-axis/off-axis configurations, and varying object distances.

Yes — custom benches are ideal for both high-precision production metrology and advanced research environments

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FAQs

A tailored optical test platform designed to address specific wavefront metrology requirements not covered by standard instruments.

 Configurable for UV, visible, near-IR, SWIR, MWIR and LWIR bands to match your optical application.

Includes wavefront error (WFE), modulation transfer function (MTF), point spread function (PSF), and comparison to design specifications.

Yes — it supports single and double-pass setups, on-axis/off-axis configurations, and varying object distances.

Yes — custom benches are ideal for both high-precision production metrology and advanced research environments

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