The Kaleo MultiWAVE Optics Test Station is an advanced optical metrology platform capable of measuring both transmitted and reflected wavefront error (TWE/RWE) across a wide range of wavelengths — from ultraviolet (UV) through visible (VIS), near-infrared (NIR), short and mid-wave infrared (SWIR/MWIR) to long-wave infrared (LWIR). This multi-wavelength interferometric system delivers high-resolution, nanometric phase measurements comparable to classical Fizeau interferometry without needing multiple instruments. With support for multiple custom wavelengths on the same test bench and a clear aperture of up to 130 mm, the station offers versatile optical qualification for lenses, filters, mirrors and complex optical assemblies.

Multi-Wavelength Capability

The Kaleo MultiWAVE test station supports multiple wavelength ranges on the same instrument without requiring separate interferometers for each spectral band. From UV through visible, NIR, SWIR, MWIR and LWIR, this flexibility allows users to perform wavefront measurements at design or operational wavelengths — ensuring the most relevant optical quality data. A single platform can be configured for standard or custom wavelengths, making it especially valuable for multi-spectral lens design, IR optical components or broadband systems.

High Resolution & Large Dynamic Range

With nanometric phase resolution and a dynamic range exceeding 500 fringes, the MultiWAVE station achieves high-accuracy wavefront error measurement approaching performance levels of traditional Fizeau interferometers — but in a far more versatile multi-wavelength configuration. This capability enables precise characterization of aberrations for both transmissive and reflective optics.

Broad Aperture Support

The system accommodates optical samples with a clear aperture up to 130 mm, making it suitable for a wide variety of components, including lenses, mirrors, filters and modules used in scientific, industrial, aerospace or imaging applications. This generous aperture size ensures that even larger optics can be characterized without additional customization.

Live Alignment and Measurement Feedback

Real-time display of phase maps and Zernike coefficients aids in optical system alignment and tuning. Live feedback simplifies setup and ensures reliable measurement repeatability, reducing operator effort and improving throughput. Whether used in R&D labs or quality control lines, this interactive alignment capability enhances productivity and measurement confidence.

Cost-Effective Single Instrument

Instead of purchasing multiple interferometers for different wavelength bands, the MultiWAVE test station consolidates capabilities into a single instrument, reducing equipment costs and simplifying metrology workflows. The modular wavelength configuration lets organizations grow their measurement capabilities without multiple hardware investments.

Optics Manufacturing & Quality Assurance

In optical component production, ensuring that lenses and mirrors meet design specifications is essential. The MultiWAVE station provides detailed wavefront error measurements at relevant operational wavelengths — whether in UV-sensitive imaging, visible optics, or infrared systems — enabling manufacturers to uphold strict quality standards and maintain high yield rates.

Infrared & Multispectral Imaging Systems

Applications like thermal imaging, SWIR machine vision and IR surveillance systems require optics that perform optimally at non-visible wavelengths. The MultiWAVE station’s broad spectral capability enables evaluation at those exact wavelengths, ensuring that imaging systems deliver sharp, consistent performance across all bands. This is crucial in aerospace, defense and industrial monitoring applications.

Laser Optics & Research Labs

Research environments often work with custom optical designs and diverse spectral sources. The MultiWAVE station allows scientists to validate optical performance precisely at the wavelengths of interest, making it ideal for laser optics characterization, fundamental photonics research and advanced optical system development.

Consumer Electronics & AR/VR

For consumer imaging systems — such as camera lenses, AR/VR optics or mixed-reality sensors — characterizing performance across multiple wavelength bands is essential for delivering accurate color and spatial resolution. The MultiWAVE station helps engineers verify that optical subsystems meet tight performance and aberration tolerances.

Automotive & ADAS Sensors

Advanced Driver Assistance Systems (ADAS) and automotive LiDAR require optics that operate reliably under diverse lighting and spectral conditions. Multi-wavelength measurements ensure lenses and optical modules meet contrast and focus requirements for safety-critical applications.

United Spectrum Instruments is the authorised distributor of high-precision optical metrology solutions, offering specialised expertise for systems such as the Kaleo MultiWAVE test station. With strong domain knowledge in photonics, wavefront metrology, and industrial optics testing, we support customers from configuration specification to workflow integration and performance optimisation. Our local presence ensures consistent, reliable results across R&D laboratories and high-throughput quality control environments.

• Authorised distributor of advanced optical and wavefront metrology systems

• Expertise in photonics, wavefront analysis, and industrial optics testing

• Support for system specification, integration, and application optimisation

• Local application engineering, operator training, and after-sales service