Precision Modular Optical Metrology Wavefront Testing System – Kaleo Kit

The Kaleo Kit is a modular wavefront metrology solution engineered for comprehensive optical quality measurement across a wide spectral range—from ultraviolet (UV) to infrared (IR)....

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Precision Modular Optical Metrology Wavefront Testing System – Kaleo Kit

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Optical metrology wavefront testing system
Optical metrology wavefront testing system

Precision Modular Optical Metrology Wavefront Testing System - Kaleo Kit

The Kaleo Kit is a modular wavefront metrology solution engineered for comprehensive optical quality measurement across a wide spectral range—from ultraviolet (UV) to infrared (IR). It combines a versatile set of interchangeable modules, including wavefront sensors, illumination units, and beam shapers, into a compact, cost-effective, and user-friendly optical testing platform suited for both laboratory and industrial environments.

Designed for efficiency and flexibility, the Kaleo Kit supports essential optical performance metrics such as transmitted and reflected wavefront error (TWE & RWE), modulation transfer function (MTF), point spread function (PSF), and detailed aberration analysis—all captured in a single acquisition. This streamlined approach reduces setup complexity while ensuring accurate, repeatable measurements across diverse optical configurations.

With its adaptable modular architecture, the Kaleo Kit seamlessly supports research, prototyping, production, and quality control workflows across a wide range of optics markets. United Spectrum Instruments is the official distributor of Phasics products in India, providing sales, technical support, and application expertise for integrating the WIC Industrial into industrial and R&D workflows

The Kaleo Kit is designed as a fully customizable metrology platform that users can tailor by selecting compatible components to suit their specific optical measurement needs. By combining high-resolution wavefront sensors with illumination modules and configurable optics, the system measures key optical properties — including wavefront aberrations and imaging performance — with nanometric sensitivity and broad dynamic range. Its modularity allows integration of modules for different spectral ranges, from UV through visible to IR, enabling a single system to address multiple testing scenarios. The result is a flexible, scalable metrology solution for optics development and production environments.

Specification Details
Measurement Type Wavefront error (TWE & RWE), MTF, PSF
Spectral Range UV to IR (190 nm – IR wavelengths)
Sensor Options Multiple SID4 wavefront sensors
Illumination Modules R-Cube modules selectable by wavelength
Beam Shaping F-number and beam expander options
Modular Architecture Fully configurable measurement setup
Sensitivity Nanometric phase resolution
Dynamic Range Broad phase measurement range
Acquisition Mode Single-shot capture
Applications Optics qualification & system alignment

Modular Design and Broad Compatibility

The Kaleo Kit is built around a modular architecture that lets users define a metrology system tailored to their specific requirements. You can choose from a suite of interchangeable wavefront sensors, illumination modules and beam shaping optics to construct a platform that covers the spectral range needed for your optics testing work. This modular flexibility supports cost-effective configuration for specific tasks without unnecessary hardware investment.

Comprehensive Measurement Capabilities

Equipped with high-resolution wavefront sensors and precision optics, the Kaleo Kit delivers advanced measurement capabilities such as modulation transfer function (MTF), point spread function (PSF), and both transmitted and reflected wavefront error (TWE & RWE). Its nanometer-scale phase sensitivity and wide dynamic range ensure accurate optical performance characterization for lenses, filters, coatings and complex optical assemblies. Because all key metrics can be captured in a single-shot acquisition, measurement time and setup complexity are significantly reduced.

Ease of Use and Quick Setup

The adaptable system is compact, easy to align and intuitive to use. Whether deployed in research laboratories or high-volume production lines, the Kaleo Kit simplifies optical metrology workflows with user-friendly hardware and software integration. Operators can quickly reconfigure the setup, change wavelength modules or swap sensors to match the testing scenario — ideal for dynamic measurement needs in R&D or industrial environments.

Scalable and Future-Ready

Thanks to its modular nature, the Kaleo Kit can evolve with your testing requirements. You can expand capabilities by adding new modules for different wavelength ranges or measurement functions. This scalability makes it a future-ready investment that grows with advancing optical technology and increasing performance demands.

Optics Manufacturing and Quality Control

High-precision optical components like lenses, mirrors and assemblies require rigorous testing throughout design, prototyping and production. The Kaleo Kit’s wavefront metrology capabilities provide manufacturers with precise assessment of optical aberrations, imaging performance and surface quality, enabling tight process control and assurance of product performance. This leads to higher yield rates and reduced rework in optics production.

Laser Systems and Adaptive Optics

In laser manufacturing and adaptive optics applications, understanding and correcting wavefront distortions is essential. The Kaleo Kit quantifies wavefront error and MTF with high resolution, supporting alignment and calibration tasks for complex laser systems. Precise metrology information is critical for optimizing beam quality, improving focus stability and ensuring consistent system performance.

Consumer Electronics & AR/VR Components

Advanced consumer devices — including smartphone cameras, augmented-reality (AR) and virtual-reality (VR) optics — demand compact, high-performance optics with minimal aberrations. The Kaleo Kit enables rapid testing of imaging lenses, wide-angle units and complex optical stacks, helping electronics manufacturers maintain quality while accelerating product development cycles.

Semiconductor & Automotive Applications

Silicon photonics, machine vision, and automotive optics (including ADAS sensors) require accurate characterization of optical systems. The Kaleo Kit’s flexible setup supports multi-wavelength metrology needed for these precision technologies, ensuring that optical subsystems meet stringent performance and reliability benchmarks.

Scientific Research & Aerospace

Research labs and aerospace programs rely on detailed optical characterization for instrumentation, telescope systems, remote sensing, and space optics qualification. The Kaleo Kit’s broad wavelength coverage and modular architecture make it well suited for experimental setups, enabling high-sensitivity measurements essential to scientific discovery and aerospace innovation.

United Spectrum Instruments is the authorised distributor of advanced optical metrology solutions, providing expert support for modular systems such as the Kaleo Kit. With deep expertise in photonics and precision measurement, we help customers select the right modules, integrate the system into their workflows, and achieve optimal performance. Our strong local presence ensures reliable results and smooth adoption across R&D and production environments.

  • Authorised distributor of advanced modular optical metrology systems

  • Expertise in photonics, precision measurement, and application engineering

  • Support for module selection, system integration, and performance optimisation

  • Local installation assistance and responsive after-sales support

FAQs

 A modular wavefront metrology system that measures optical quality, wavefront error, MTF and PSF from UV to IR wavelengths.

Yes — its modular design lets you select sensors, illumination and beam shaping components to fit precise measurement needs.

 It captures transmitted and reflected wavefront error (TWE/RWE), aberrations, MTF and point spread function (PSF).

The system supports measurements from ultraviolet (UV) through visible and infrared (IR) wavelengths.

 Yes — its compact and easy-to-use modular configuration supports both research labs and industrial metrology workflows. 

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FAQs

 A modular wavefront metrology system that measures optical quality, wavefront error, MTF and PSF from UV to IR wavelengths.

Yes — its modular design lets you select sensors, illumination and beam shaping components to fit precise measurement needs.

 It captures transmitted and reflected wavefront error (TWE/RWE), aberrations, MTF and point spread function (PSF).

The system supports measurements from ultraviolet (UV) through visible and infrared (IR) wavelengths.

 Yes — its compact and easy-to-use modular configuration supports both research labs and industrial metrology workflows. 

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