Ultra-Violet (UV) High Resolution Wavefront Sensor
Precision in ultraviolet wavefront sensing is critical for today’s advanced optical research and high-energy laser systems. The SID4-UV HR Wavefront Sensor...
Ultra-Violet (UV) High Resolution Wavefront Sensor
Precision in ultraviolet wavefront sensing is critical for today’s advanced optical research and high-energy laser systems. The SID4-UV HR Wavefront Sensor from Phasics is designed to meet this demand. Equipped with patented QuadriWave Lateral Shearing Interferometry (QWLSI), this high-resolution sensor enables real-time, single-shot measurement of wavefront and intensity from UV sources with nanometric accuracy.
United Spectrum Instruments distributes the SID4-UV HR exclusively in India. It is the ideal solution for UV beam diagnostics, optical component testing, and adaptive optics control in scientific and industrial settings.
Unlike conventional sensors, the SID4-UV HR is optimised for ultraviolet wavelengths, offering superior performance for applications involving excimer lasers, UV lithography systems, and high-power laser facilities. Its compact, camera-like design integrates easily into both R&D environments and production setups.
By capturing >24,000 data points in a single shot, the sensor delivers high-fidelity phase mapping, enabling users to assess beam uniformity, alignment precision, and optical surface quality across the 190–400 nm UV spectrum.
Understanding Ultra-Violet (UV) High Resolution Wavefront Sensor
The SID4-UV HR Wavefront Sensor is a high-resolution optical metrology solution specifically designed for ultraviolet (UV) applications. Using Phasics’ patented quadriwave lateral shearing interferometry (QWLSI®) technology, it delivers precise, quantitative phase measurements of UV laser beams and optical systems. With its exceptional dynamic range and sensitivity, it ensures accurate characterisation of optical aberrations, beam quality, and focusing performance. Compact, robust, and easy to integrate, the SID4-UV HR is ideal for semiconductor lithography, UV laser development, and advanced research applications that demand unmatched precision in ultraviolet optical metrology.
Technical Specifications
| Parameter | Value |
| Wavelength Range | 190 – 400 nm |
| Sensing Technology | QuadriWave Lateral Shearing Interferometry (QWLSI) |
| Phase Accuracy | < λ/100 rms |
| Spatial Resolution | ~27.6 µm |
| Phase Sampling | 182 x 136 (~24,000 points) |
| Phase Resolution | < 2 nm RMS |
| Absolute Accuracy | ~10 nm RMS |
| Frame Rate | Up to 60 fps |
| Real-Time Processing | Up to 10 Hz full-resolution |
| Dimensions (WxHxL) | 62 x 64 x 94 mm³ |
| Weight | ~450 g |
| Interface | GigE (Gigabit Ethernet) |
Key Features and Advantages
QWLSI® Technology
Patented interferometry providing high-resolution quantitative phase measurements in the UV range.
Ultraviolet Optimisation
Engineered to measure and analyse UV light sources and optics with superior accuracy.
High Dynamic Range
Captures both strong aberrations and subtle variations in wavefronts.
Real-Time Monitoring
Fast acquisition speeds enable observation of dynamic UV processes.
Compact & Robust Build
Designed for easy integration into research laboratories and industrial setups.
Advanced Analysis Tools
Generates wavefront, MTF, and PSF data for comprehensive optical evaluation.
Advantages:
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Specially optimised for ultraviolet optical metrology
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Provides superior accuracy in UV laser and lithography beam characterisation
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Detects fine aberrations and subtle defects beyond conventional sensors
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Ensures real-time feedback for process optimisation and control
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Compact design simplifies integration into existing optical benches and systems
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Enhances yield and reliability in semiconductor and photonics manufacturing
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Supports adaptive optics and high-resolution imaging applications
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Trusted solution for research centres and high-tech industries requiring UV precision
Applications Across Industries
Semiconductor & Lithography
Provides precise UV metrology for lithography optics, laser alignment, and process optimisation.
Aerospace & Defence
Supports adaptive optics and UV laser testing for advanced aerospace applications.
Medical & Biomedical Research
Optimises UV-based imaging systems for microscopy, diagnostics, and medical device prototyping.
Photonics & Laser Manufacturing
Characterises UV lasers and optical systems for beam shaping and system integration.
Research & Development Centres
Delivers universities and labs advanced metrology tools for UV optical studies.
Industrial Quality Assurance
Ensures precision testing of UV optics used in manufacturing and inspection systems.
The SID4-UV HR Wavefront Sensor redefines ultraviolet optical metrology by delivering superior precision, dynamic range, and integration flexibility.
Why Choose United Spectrum Instruments?
United Spectrum Instruments is the authorised distributor of SID4-UV HR Wavefront Sensors in India, offering expert solutions for UV optical metrology.
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Genuine Phasics SID4-UV HR systems with full manufacturer warranty
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Expertise in semiconductor, photonics, and UV laser applications
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Pan-India training, installation, and after-sales technical support
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Application-specific consultation for research, lithography, and biomedical sectors
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Competitive pricing with reliable local customer care
With extensive experience in advanced optical instrumentation, United Spectrum Instruments ensures Indian industries and research centres gain access to cutting-edge UV wavefront sensing solutions for unmatched measurement accuracy.
FAQs
What makes the SID4-UV HR suitable for UV applications?
The SID4-UV HR features UV-optimised optics and coatings, enabling accurate wavefront measurement in the 190–400 nm range – ideal for excimer lasers and lithography.
Can it handle pulsed UV lasers?
Yes. Its single-shot acquisition makes it perfect for pulsed and high-energy UV laser diagnostics.
Does it work in cleanroom or vacuum environments?
Yes. The compact design and optical path compatibility allow use in sensitive environments like semiconductor fabs and research vacuum chambers.
Can the SID4-UV HR measure incoherent UV sources?
Absolutely. It supports both coherent and incoherent UV sources, including broadband and partially coherent beams.
Is the SID4-UV HR better than a Shack-Hartmann sensor?
Yes, for most high-resolution and UV-specific applications. It offers better resolution, broader light compatibility, and single-shot precision.
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FAQs
What makes the SID4-UV HR suitable for UV applications?
The SID4-UV HR features UV-optimised optics and coatings, enabling accurate wavefront measurement in the 190–400 nm range – ideal for excimer lasers and lithography.
Can it handle pulsed UV lasers?
Yes. Its single-shot acquisition makes it perfect for pulsed and high-energy UV laser diagnostics.
Does it work in cleanroom or vacuum environments?
Yes. The compact design and optical path compatibility allow use in sensitive environments like semiconductor fabs and research vacuum chambers.
Can the SID4-UV HR measure incoherent UV sources?
Absolutely. It supports both coherent and incoherent UV sources, including broadband and partially coherent beams.
Is the SID4-UV HR better than a Shack-Hartmann sensor?
Yes, for most high-resolution and UV-specific applications. It offers better resolution, broader light compatibility, and single-shot precision.
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